This family of burn-in test sockets includes sockets for Rambus memory devices. Featuring an open-top, auto-load/unload design for ease of use, the new Rambus sockets accommodate smaller RDRAM devices, down to 0.75 mm with 0.5 mm under development, and a greater range of I/O pins: 54, 62 and 74 I/O. The sockets also are said to accommodate the high-volume Rambus DRAM, including 64, 72, 128, 144, 256 and 288 Mb devices.
Texas Instruments Inc.
Mansfield, Mass.




