May 21, 2009--Agilent Technologies Inc. today will demonstrate its SuperSpeed USB test solution portfolio here at a Developers Conference. This is the industry's first high-performance SuperSpeed USB test fixture coupled with NEC Electronics' USB 3.0 host controller. Agilent will also demonstrate its USB 3.0 portfolio, which consists of fully automated transmitter and receiver tests the company says are key to efficient compliance tests and systematic product characterization of SuperSpeed USB.
USB 3.0 is an update of the well-established, widespread standard driven by USB Implementers Forum Inc., a non-profit corporation founded by the group of companies that developed the Universal Serial Bus (USB) specification. USB receiver jitter tolerance testing became mandatory with the recent release of the USB 3.0 specification version 1.0. USB 3.0 is also known as SuperSpeed USB.
NEC Electronics' USB 3.0 host controller is the industry's first USB 3.0 product. NEC Electronics offers both USB 3.0 host controller and device silicon for end-to-end product coverage of the USB 3.0 market. The company has completed full receiver jitter tolerance test verification as required by the USB 3.0 specification and transmitter test requirements.
Agilent offers a complete USB 3.0 test solution for transmitter and receiver test, comprised of a DSA91304A Infiniium oscilloscope, a USB 3.0 test fixture, a pattern checker and pattern generator based on the J-BERT N4903A/B high-performance serial BERT, an N5181A MXG RF analog signal generator, 81150A pulse function arbitrary noise generator and the N5990A test automation software platform from Agilent's partner BitifEye Digital Test Solutions.
On the Web: www.agilent.com/find/usb
