RF test sockets target high volume ATE environments - Connector Specifier

RF test sockets target high volume ATE environments


Dec 7, 2006

December 7, 2006 -- Ardent Concepts, Inc. (www.ardentconcepts.com) says that its newest test socket technology for small leadless devices is capable of handling the toughest high volume ATE environments for multi-GHz RF testing.

According to the company, designed to withstand over 100,000 insertions with no maintenance intervals, the RC Scrub-R test sockets can be refurbished quickly and easily in the field, and are more cost effective than traditional offset test socket solutions.

The company says the product's patented design employs semi-precious contact technology, allowing for consistent DC resistance, long life, and exceptional AC performance.

"RC Scrub-R represents a fundamental new direction in our approach to ATE environments," says Gordon Vinther, president and founder of Ardent Concepts. "We now have a solution with the linear action and oxide penetrating capability necessary for the most difficult high volume tests. With this product, we can offer our customers a lower cost of ownership, higher first pass yields, and the most consistent AC performance available in a test socket today."

The RC Scrub-R sockets are available for chipscale packages as small as 1 mm x 1 mm, with a pitch capability of .5 mm.


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